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Updated: Aug 6, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
Diamond probe preparation for developing faster high-speed atomic force microscopy
Ou Zhang1,2, Shingo Fukuda3, Sichen Mi4
1Tianjin Key Lab for Rare Earth Materials and Applications, Center for Rare Earth and Inorganic Functional Materials, Smart Sensor Interdisciplinary Science Center, School of Materials Science and Engineering, Nankai University, Tianjin 300350, China.
We developed a hybrid nanofabrication method to create ultrathin single-crystal diamond cantilevers. These diamond probes enable faster, high-resolution imaging for advanced microscopy applications.
Area of Science:
- Materials Science
- Nanotechnology
- Mechanical Engineering
Background:
- Single-crystal diamond (SCD) is a superior material for advanced sensing and imaging.
- Nanoscale fabrication of ultrathin, free-standing SCD devices is difficult.
- Existing methods face limitations in speed and precision for high-performance applications.
Purpose of the Study:
- To develop a universal hybrid micro/nanofabrication strategy for ultrathin SCD devices.
- To overcome performance limits in high-speed atomic force microscopy (HS-AFM).
- To enable fabrication of high-frequency, high-performance SCD cantilevers.
Main Methods:
- Combined high-throughput angled laser micromachining with focused ion beam refinement.
- Achieved precise geometric control and nanoscale surface flatness.
- Integrated amorphous carbon tips using electron-beam-induced deposition.
Main Results:
- Fabricated free-standing SCD cantilevers (∼7 × 2 × 0.08-0.15 μm³).
- Achieved resonance frequencies 3-4 times higher than commercial cantilevers (3.7-6.0 MHz).
- Demonstrated stable HS-AFM imaging of actin filaments at 25 fps.
Conclusions:
- The hybrid method enables scalable fabrication of high-performance diamond nanostructures.
- This approach advances ultrafast HS-AFM and nanomechanical sensing.
- Opens opportunities for micro- and nanoelectromechanical systems.
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