Related Experiment Video
Updated: Aug 15, 2026

16:11
Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
High-precision absolute distance measurement based on double-pass intensity modulation with an S-G-filter-assisted
Optics Express
|August 14, 2026
Summary
This study presents a high-precision absolute distance measurement system using double-pass intensity modulation and a novel wobbling algorithm. The system achieves a relative measurement precision of 10-8 for distances up to 100 meters.
Area of Science:
- Optics and Photonics
- Metrology
- Instrumentation Engineering
Background:
- Accurate distance measurement is critical in various scientific and industrial applications.
- Existing absolute distance measurement (ADM) systems face limitations in precision and range.
Purpose of the Study:
- To propose and experimentally demonstrate a high-precision ADM system.
- To achieve a relative measurement precision on the order of 10-8 over a wide distance range.
Main Methods:
- Utilizing double-pass intensity modulation with a Mach-Zehnder modulator (MZM).
- Implementing a Savitzky-Golay (S-G) filter-assisted wobbling algorithm for frequency-sweep curve analysis.
- Employing a field-programmable gate array (FPGA) for real-time ADM algorithm processing.
Main Results:
- Experimental demonstration of the proposed ADM system.
- Achieved relative measurement precision of 10-8 for distances from 1 to 100 m.
- Standard deviations of 0.17 μm at 2 m and 8.91 μm at 100 m were recorded.
Conclusions:
- The developed system offers a robust solution for high-precision absolute distance measurement.
- The combination of double-pass modulation, S-G filtering, and wobbling algorithm enables superior accuracy.
- The FPGA implementation ensures practical applicability for real-world scenarios.
