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Updated: Sep 3, 2026
Atomically Defined Templates for Epitaxial Growth of Complex Oxide Thin Films
Published on: December 4, 2014
Seed layer formation by deposition of micro-crystallites on a revolving substrate. Part II: application to some
Arthur Ballato1, John Ballato2
1Holcombe Department of Electrical and Computer Engineering, Clemson University, Clemson, SC 29634, USA.
Abstract:
The matrix method of averaging material coefficients of crystallites deposited at an angle to a revolving substrate, disclosed in the prequel [Ballato & Ballato (2024). Acta Cryst. B80, 760-765], is applied to tensors in their indicial form. The results are used to determine averaged nonlinear dielectric, piezoelectric, and elastic constants, as well as linear pyroelectric coefficients, for triclinic crystals; these are further specialized for Laue classes of higher symmetry.
