Interferometric Vector Piezoresponse Force Microscopy for Simultaneous Ferroelectric Domain and Crystallographic...

Ongoing advances in scanning probe microscopy techniques are continually expanding the possibilities for nanoscale characterization and correlated studies of functional materials. Here, we demonstrate how a recent extension of piezoresponse force microscopy (PFM), known as interferometric vector PFM, can be utilized for simultaneously mapping the local crystallographic orientation and the domain structure of distributed grains in uniaxial ferroelectric polycrystals, without requiring complementary characterization techniques, such as electron backscattered diffraction (EBSD). By shifting the laser beam position on the cantilever, direction-dependent piezoresponse signals are acquired analogous to classical vector PFM, but without the need to rotate the sample. Using polycrystalline ${\mathrm{ErMnO}}_3$ as a model system, we demonstrate that the reconstructed piezoresponse vectors correlate one-to-one with the crystallographic orientations of the micrometer-sized grains, carrying grain-orientation and domain-related information. We establish a versatile approach for rapid, multimodal characterization of polycrystalline uniaxial ferroelectrics, enabling automated, high-throughput reconstruction of polarization and grain orientations with nanoscale precision.