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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Apr 23, 2026

Quantitative Hardness Measurement by Instrumented AFM-indentation

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

Lateral force microscopy calibration using an interferometric atomic force microscope.

Joel A Lefever¹, Aleksander Labuda¹, Roger Proksch¹

¹Oxford Instruments Asylum Research, Inc., Santa Barbara, CA, 93117.

The Review of Scientific Instruments

|April 21, 2026

Summary

This summary is machine-generated.

A novel atomic force microscope (AFM) method enables automatic lateral force calibration using dual detectors and in situ tip height measurement. This approach simplifies calibration, offering accuracy comparable to existing methods.

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Area of Science:

Materials Science
Nanotechnology
Physics

Background:

Atomic Force Microscopy (AFM) is crucial for nanoscale surface analysis.
Accurate lateral force calibration is essential for reliable AFM measurements.
Existing calibration methods can be complex and require significant user input.

Purpose of the Study:

To introduce a new, automated method for lateral force calibration in AFM.
To enhance the accuracy and efficiency of AFM lateral force measurements.
To enable in situ tip height measurement for comprehensive calibration.

Main Methods:

Utilized both interferometric and optical beam detectors on a single AFM instrument.
Developed an automated protocol requiring minimal user intervention.
Integrated in situ probe tip height measurement capabilities.
Validated tip height measurements against electron microscopy.

Main Results:

Achieved complete lateral force calibration without sample or probe manipulation.
Demonstrated agreement between in situ tip height measurements and electron micrographs within 1.4 μm.
Showcased consistency between the new method and the wedge calibration method within its uncertainty.

Conclusions:

The new AFM lateral force calibration method is accurate, efficient, and automated.
In situ tip height measurement is a reliable component of the calibration process.
This technique offers a significant advancement for nanoscale force measurements.