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Published on: May 21, 2016
Cryogenic Characterisation of a Commercial Low-Noise Amplifier (LNA) for MKID Readout Systems
Dylan E Santos-Verzilli1,2, Diego Portero-Rodríguez1,3, Hugo García-Vázquez1
1Laboratorio de Circuitos Integrados (LABIC), Departamento de Electrónica, Área de Instrumentación, Instituto de Astrofísica de Canarias (IAC), 38205 La Laguna, Spain.
Abstract:
The use of non-certified commercial electronics for cryogenic applications may be attractive due to their reduced cost and high availability, but they also carry risks related to reliability, performance, and thermal compatibility. The decision to use commercial components that are not certified for cryogenics instead of components specifically designed for such applications must be carefully weighed based on specific project needs and risk tolerances. This work presents the characterisation of a Low-Noise Amplifier (LNA) at cryogenic temperatures for use in astronomical instrumentation applications with a microwave kinetic inductance detector (MKID) readout system. The cooling system comprises a cryostat, a cold head operating in a closed-cycle helium refrigeration system based on the Gifford-McMahon principle, a compressor, connectors, cables, a vacuum pump, pressure and temperature sensors, and a temperature control system. The circuit was characterised over the temperature range of 295.4 K to 78.3 K.

