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Related Concept Videos

X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
Confocal Fluorescence Microscopy01:16

Confocal Fluorescence Microscopy

Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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Related Experiment Video

Updated: May 29, 2026

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
08:51

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography

Published on: May 26, 2008

A scanning x-ray microscope using synchrotron radiation.

P Horowitz, J A Howell

    Science (New York, N.Y.)
    |November 10, 1972
    PubMed
    Summary
    This summary is machine-generated.

    A new scanning X-ray microscope uses focused synchrotron radiation to create 3D, element-specific images of thick samples in air. This advancement allows for detailed analysis of materials without vacuum requirements.

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    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

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    Related Experiment Videos

    Last Updated: May 29, 2026

    Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
    08:51

    Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography

    Published on: May 26, 2008

    Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
    08:46

    Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

    Published on: April 13, 2016

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
    10:12

    Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

    Published on: June 19, 2018

    Area of Science:

    • Materials Science
    • Microscopy
    • Physics

    Background:

    • Conventional microscopy often requires vacuum environments, limiting the analysis of certain samples.
    • Element-specific imaging provides crucial information about material composition.

    Purpose of the Study:

    • To develop a scanning X-ray microscope capable of analyzing thick specimens.
    • To enable stereoscopic and element-discriminating imaging in an atmospheric environment.

    Main Methods:

    • Utilized focused synchrotron radiation.
    • Employed a pinhole for collimation to create a focused beam.
    • Developed a scanning mechanism for image acquisition.

    Main Results:

    • Successfully constructed a scanning X-ray microscope.
    • Achieved stereoscopic imaging capabilities.
    • Demonstrated element-discriminating image generation for thick specimens.
    • Operated the microscope in an atmospheric environment.

    Conclusions:

    • The developed scanning X-ray microscope is effective for analyzing thick samples.
    • The ability to image in air simplifies sample preparation and expands application scope.
    • This technique offers a novel approach for 3D elemental mapping.