An improved specimen table for the Balzers freeze etching system BAF 400
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Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
Published on: July 26, 2014
Journal of Microscopy
|August 1, 1982
Abstract:
A time saving, simple and inexpensive adaptation of a Balzers specimen table is described. This specimen table is used in combination with the small specimen holders originally developed for the Denton Freeze-etching module. They are in particular suited for cell suspensions, and are easy to handle for freezing procedures. Ten replicas are produced routinely per freeze fracture run, with the aid of this combined system.

