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Incidence of rapid resolution of defects on stress thallium scans
Clinical Nuclear Medicine
|October 1, 1982
Abstract:
A prospective study was performed to determine the frequency with which defects on stress thallium images undergo rapid resolution. Analysis of paired views showed that 15% of the defects present in anterior views resolve in less than 30 minutes. This study documents the loss of sensitivity that can occur if imaging does not begin promptly after injection.