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X-ray scanning microanalysis of Sporothrix schenckii
1Laboratoire de Parasitologie et Mycologie, Paris, France.
Cytobios
|January 1, 1994
Abstract:
X-ray scanning microanalysis was applied to the study of fungal samples such as Sporothrix schenckii. This technique is sufficiently sensitive to detect many elements in the periodical classification of Mendeleev.
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