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Noninvasive high-voltage measurement in mammography by crystal diffraction spectrometry
R D Deslattes1, J C Levin, M D Walker
1National Institute of Standards and Technology, Gaithersburg, Maryland 20899.
Medical Physics
|January 1, 1994
Abstract:
Wavelength dispersive crystal diffraction spectrometry has been applied to the measurement of the accelerating voltage on an x-ray source in a prototype experiment in the mammographic source. The results indicate that this noninvasive approach can yield determinations of such voltages within 0.1 kV, a level of imprecision that appears adequate for high-level standardization of such potentials.