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Simple procedure for phase identification using convergent beam electron diffraction patterns

G H Kim1, H S Kim, D W Kum

  • 1Division of Metals, Korea Institute of Science and Technology, Seoul, Korea.

Microscopy Research and Technique
|April 15, 1996
PubMed
Summary
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This study introduces a novel method using primitive cell volume and zero order Laue zone (ZOLZ) patterns for accurate phase identification in complex microstructures. This approach enhances reliability in materials analysis.

Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Complex microstructures often contain multiple phases, making identification challenging.
  • Accurate phase identification is crucial for understanding material properties and performance.

Purpose of the Study:

  • To develop a reliable method for identifying phases within complex microstructures.
  • To utilize convergent beam electron diffraction (CBED) patterns for quantitative phase analysis.

Main Methods:

  • Calculating primitive cell volume from a single CBED pattern, including higher-order Laue zone rings.
  • Determining the crystal zone axis using the zero-order Laue zone (ZOLZ) pattern.
  • Employing a computer program for phase screening based on cell volume and ZOLZ pattern indexing.

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Main Results:

  • A single CBED pattern from a nanosized region provides sufficient data for phase identification.
  • The combination of cell volume measurement and ZOLZ pattern analysis ensures high accuracy and reliability.
  • The method was successfully demonstrated on the rapidly solidified Al-Al3Ti system.

Conclusions:

  • The proposed method offers an efficient and accurate way to identify phases in complex materials.
  • This technique simplifies phase analysis from electron diffraction data.
  • It has significant implications for materials characterization and research.