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Processor quality control in laser imaging systems
T M Bogucki1, W R Murphy, C W Baker
1Eastman Kodak Company, Rochester, New York 14650, USA.
Abstract:
Sensitometric techniques for performing processor quality control in laser imaging systems are analyzed in this study. The sensitivity of conventional x-ray films using simulated screen-light sensitometry is compared with helium-neon (HeNe) laser film exposed with a simulated red-light sensitometer, a standalone (reference) laser sensitometer, an experimental (unstable) laser sensitometer, and laser printers. Infrared (IR) laser film exposed with an IR laser diode and a simulated IR sensitometer are also evaluated. It is demonstrated that laser-generated step tablets provide an easy and reliable method of performing laser film processor quality control.