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Ultramicrotomy on fretting wear debris
Microscopy Research and Technique
|April 29, 1998
Abstract:
A TEM-sample preparation method for small amounts of fretting wear debris is presented. After embedding in a resin, the debris are ultramicrotomed to ultra-thin sections. In this way, valuable observation of nanocrystalline fretting wear debris originating from TiN-coatings could be rapidly obtained.