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Reliability of closed double helix electrode for functional electrical stimulation
H Kagaya1, M Sharma, G Polando
1Veterans Administration Medical Center, Cleveland, OH 44106-1702, USA.
Clinical Orthopaedics and Related Research
|May 13, 1998
Summary
The closed double helix electrode shows acceptable reliability for implantable functional electrical stimulation systems. This intramuscular electrode demonstrated improved performance compared to previous designs.
Area of Science:
- Biomedical Engineering
- Neuroscience
- Rehabilitation Technology
Background:
- Functional electrical stimulation (FES) systems require reliable implanted electrodes for therapeutic applications.
- Totally implantable FES systems offer advantages in long-term use but depend on electrode durability.
Purpose of the Study:
- To evaluate the reliability of a closed double helix electrode for use in totally implantable FES systems.
- To compare the reliability of the closed double helix electrode with open designs and other existing electrodes.
Main Methods:
- Retrospective analysis of 80 implanted intramuscular closed double helix electrodes.
- Evaluation of electrode survival over a mean period of 15 months (1222 electrode-months total).
- Analysis of failure modes, including increased impedance and undesirable recruitment changes.
Main Results:
- Cumulative survival proportions were 0.934 at 6 months and 0.730 after 30 months.
- Fifteen electrodes failed; 2/3 of failures occurred within the first 10 months.
- The closed double helix electrode showed higher reliability than the open design at 6 months.
Conclusions:
- The closed double helix electrode demonstrates acceptable reliability for totally implantable FES systems.
- This electrode design is a viable component for advanced neuroprosthetic applications.
- Further research may focus on optimizing longevity and reducing early-stage failures.