Technique for identification of submicron metal particulate from implants in histological specimens

Metal implants are being used with increasing frequency for the treatment of many diseases in the field of orthopedics, cardiology, cardiovascular surgery, and otolaryngology. Unfortunately, metals can be a source of submicron particles, which may have adverse effects on tissues. This article describes a technique that uses backscattered electron imaging and energy dispersive X-ray microanalysis, which have the capacity to perform both quantitative and qualitative analysis. The particles can be characterized by size, shape, amount, and composition. Although this technique can be used near the implant interface, it is particularly helpful in tissues a great distance from the implant site with a low concentration of metal debris. In addition, the sensitivity and specificity of this technique can be adjusted to the investigator's needs.