Bone-implant interface, objectivization of X-ray microanalysis

Several techniques of the bone-implant interface uncovering in the proper way for X-ray microanalysis, were tested. The obtained results confirmed that the method of sample preparation has significantly influenced the results of investigation. The mechanical polishing, which is routinely used for preparation of surfaces to the X-ray microanalysis, introduces artifacts. Cutting by means of microtome, in the case of brittle implants, and sawing by utilizing diamond saw, in the case of metallic ones, were indicated as the optimal methods. Cleaning of the samples in the ultrasonic cleaner before covering them with conductive layer is required.