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Ultramicroscopy|November 3, 2017
Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulationsT Friedrich, A Bochmann, J Dinger, et al.Nanotechnology|August 6, 2011
Optically controlled thermal management on the nanometer length scaleF Garwe, U Bauerschäfer, A Csaki, et al.Pageof 1