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Physical Review Letters|June 13, 2002
Quantitative electron holography of biased semiconductor devicesA C Twitchett, R E Dunin-Borkowski, P A MidgleyJournal of Microscopy|February 7, 2009
Quantitative off-axis electron holography of GaAs p-n junctions prepared by focused ion beam millingD Cooper, R Truche, A C Twitchett-Harrison, et al.Journal of Microscopy|May 26, 2004
Off-axis electron holography of electrostatic potentials in unbiased and reverse biased focused ion beam milled semiconductor devicesA C Twitchett, R E Dunin-Borkowski, R J Hallifax, et al.Ultramicroscopy|August 20, 2013
Finite element simulations of electrostatic dopant potentials in thin semiconductor specimens for electron holographyP K Somodi, A C Twitchett-Harrison, P A Midgley, et al.Nature Communications|April 9, 2020
Real-space imaging of confined magnetic skyrmion tubesM T Birch, D Cortés-Ortuño, L A Turnbull, et al.Pageof 1