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Ultramicroscopy|November 17, 2012
Variable magnification dual lens electron holography for semiconductor junction profiling and strain mappingY Y Wang, J Li, A Domenicucci, et al.Ultramicroscopy|September 29, 2004
Off-axis electron holography with a dual-lens imaging system and its usefulness in 2-D potential mapping of semiconductor devicesY Y Wang, M Kawasaki, J Bruley, et al.Pageof 1