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Applied Optics|August 25, 2010
Kirkpatrick-Baez microscope based on a Bragg-Fresnel x-ray multilayer focusing systemP Dhez, A Erko, E Khzmalian, et al.The Journal of Chemical Physics|October 15, 2013
Structural motifs of pre-nucleation clustersY Zhang, I R Türkmen, B Wassermann, et al.Optics Express|November 18, 2014
Fabrication of digital rainbow holograms and 3-D imaging using SEM based e-beam lithographyAn Firsov, A Firsov, B Loechel, et al.Optics Express|November 23, 2021
Piezo-modulated active grating for selecting X-ray pulses separated by one nanosecondS Vadilonga, I Zizak, D Roshchupkin, et al.Journal of Synchrotron Radiation|June 26, 2007
Two-step hard X-ray focusing combining Fresnel zone plate and single-bounce ellipsoidal capillaryA Snigirev, A Bjeoumikhov, A Erko, et al.Journal of Synchrotron Radiation|February 24, 2007
Submicrometer hard X-ray focusing using a single-bounce ellipsoidal capillary combined with a Fresnel zone plateA Snigirev, A Bjeoumikhov, A Erko, et al.Journal of Nanoscience and Nanotechnology|December 8, 2010
Application of conventional and microbeam synchrotron radiation x-ray fluorescence and absorption for the characterization of human nailsM Katsikini, A Mavromati, F Pinakidou, et al.Journal of Hazardous Materials|September 22, 2006
On the distribution and bonding environment of Zn and Fe in glasses containing electric arc furnace dust: a mu-XAFS and mu-XRF studyF Pinakidou, M Katsikini, E C Paloura, et al.Journal of Synchrotron Radiation|December 25, 2015
The at-wavelength metrology facility for UV- and XUV-reflection and diffraction optics at BESSY-IIF Schäfers, P Bischoff, F Eggenstein, et al.The Review of Scientific Instruments|June 3, 2016
At-wavelength metrology facility for soft X-ray reflection opticsA Sokolov, P Bischoff, F Eggenstein, et al.Pageof 2