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Applied Optics
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April 8, 2010
Spectral measurements of stack effluents using a double-beam interferometer with background suppression
O Shepherd, A G Hurd, R B Wattson, et al.
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Showing results (1-10 of 1) with videos related to
Sort By:
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Applied Optics
|
April 8, 2010
Spectral measurements of stack effluents using a double-beam interferometer with background suppression
O Shepherd, A G Hurd, R B Wattson, et al.
Page
of 1