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A G Shard

Showing results (1-10 of 17) with videos related to

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Journal of Synchrotron Radiation|July 21, 2004
An electrostrictive drive for fine pitch control in double-crystal monochromatorsA G Shard, V R Dhanak, A D Smith
The Journal of Physical Chemistry. B|January 17, 2015
Angle dependence of argon gas cluster sputtering yields for organic materialsM P Seah, S J Spencer, A G Shard
The Journal of Physical Chemistry. B|December 22, 2009
Sample cooling or rotation improves C60 organic depth profiles of multilayered reference samples: results from a VAMAS interlaboratory studyP Sjövall, D Rading, S Ray, et al.
Surface and Interface Analysis : SIA|April 21, 2015
Dual beam organic depth profiling using large argon cluster ion beamsM Holzweber, A G Shard, H Jungnickel, et al.
The Journal of Physical Chemistry. B|October 1, 2015
Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster IonsM P Seah, R Havelund, A G Shard, et al.
Analytical Chemistry|January 2, 2009
Analysis of the interface and its position in C60(n+) secondary ion mass spectrometry depth profilingF M Green, A G Shard, I S Gilmore, et al.
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|February 1, 2017
Evaluation of Two Methods for Determining Shell Thicknesses of Core-Shell Nanoparticles by X-ray Photoelectron SpectroscopyC J Powell, W S M Werner, A G Shard, et al.
Journal of Synchrotron Radiation|July 21, 2004
Performance of the VUV beamline 4.1 at the SRS, Daresbury LaboratoryV R Dhanak, A G Shard, C A Muryn, et al.
The Analyst|September 2, 2015
Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster sizeM P Seah, S J Spencer, R Havelund, et al.
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|June 12, 2018
Comparisons of Analytical Approaches for Determining Shell Thicknesses of Core-Shell Nanoparticles by X-ray Photoelectron SpectroscopyC J Powell, W S M Werner, H Kalbe, et al.
Pageof 2

Showing results (1-10 of 17) with videos related to

Sort By:
Pageof 2
Journal of Synchrotron Radiation|July 21, 2004
An electrostrictive drive for fine pitch control in double-crystal monochromatorsA G Shard, V R Dhanak, A D Smith
The Journal of Physical Chemistry. B|January 17, 2015
Angle dependence of argon gas cluster sputtering yields for organic materialsM P Seah, S J Spencer, A G Shard
The Journal of Physical Chemistry. B|December 22, 2009
Sample cooling or rotation improves C60 organic depth profiles of multilayered reference samples: results from a VAMAS interlaboratory studyP Sjövall, D Rading, S Ray, et al.
Surface and Interface Analysis : SIA|April 21, 2015
Dual beam organic depth profiling using large argon cluster ion beamsM Holzweber, A G Shard, H Jungnickel, et al.
The Journal of Physical Chemistry. B|October 1, 2015
Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster IonsM P Seah, R Havelund, A G Shard, et al.
Analytical Chemistry|January 2, 2009
Analysis of the interface and its position in C60(n+) secondary ion mass spectrometry depth profilingF M Green, A G Shard, I S Gilmore, et al.
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|February 1, 2017
Evaluation of Two Methods for Determining Shell Thicknesses of Core-Shell Nanoparticles by X-ray Photoelectron SpectroscopyC J Powell, W S M Werner, A G Shard, et al.
Journal of Synchrotron Radiation|July 21, 2004
Performance of the VUV beamline 4.1 at the SRS, Daresbury LaboratoryV R Dhanak, A G Shard, C A Muryn, et al.
The Analyst|September 2, 2015
Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster sizeM P Seah, S J Spencer, R Havelund, et al.
The Journal of Physical Chemistry. C, Nanomaterials and Interfaces|June 12, 2018
Comparisons of Analytical Approaches for Determining Shell Thicknesses of Core-Shell Nanoparticles by X-ray Photoelectron SpectroscopyC J Powell, W S M Werner, H Kalbe, et al.
Pageof 2