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A K Kambham

Showing results (1-10 of 3) with videos related to

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Ultramicroscopy|January 15, 2011
Atom probe analysis of a 3D finFET with high-k metal gateM Gilbert, W Vandervorst, S Koelling, et al.
Ultramicroscopy|February 4, 2011
Atom-probe for FinFET dopant characterizationA K Kambham, J Mody, M Gilbert, et al.
Ultramicroscopy|February 5, 2011
Characteristics of cross-sectional atom probe analysis on semiconductor structuresS Koelling, N Innocenti, G Hellings, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|January 15, 2011
Atom probe analysis of a 3D finFET with high-k metal gateM Gilbert, W Vandervorst, S Koelling, et al.
Ultramicroscopy|February 4, 2011
Atom-probe for FinFET dopant characterizationA K Kambham, J Mody, M Gilbert, et al.
Ultramicroscopy|February 5, 2011
Characteristics of cross-sectional atom probe analysis on semiconductor structuresS Koelling, N Innocenti, G Hellings, et al.
Pageof 1