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The Journal of Chemical Physics|July 16, 2018
Relation between image charge and potential alignment corrections for charged defects in periodic boundary conditionsT R Durrant, S T Murphy, M B Watkins, et al.The Journal of Physical Chemistry. B|July 21, 2006
Probing organic layers on the TiO2(110) surfaceA S Foster, A Y Gal, R M Nieminen, et al.Physical Review Letters|June 25, 2011
Chemical resolution at ionic crystal surfaces using dynamic atomic force microscopy with metallic tipsG Teobaldi, K Lämmle, T Trevethan, et al.Physical Review Letters|February 3, 2004
Interaction of silicon dangling bonds with insulating surfacesA S Foster, A Y Gal, J D Gale, et al.Ultramicroscopy|December 15, 2010
Mechanism of laser assisted field evaporation from insulating oxidesM Tsukada, H Tamura, K P McKenna, et al.Scientific Reports|August 26, 2017
Intrinsic Resistance Switching in Amorphous Silicon Suboxides: The Role of Columnar MicrostructureM S Munde, A Mehonic, W H Ng, et al.Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|July 23, 2008
Atomistic mesh generation for the simulation of nanoscale metal-oxide-semiconductor field-effect transistorsM Aldegunde, Natalia Seoane, A J García-Loureiro, et al.Pageof 2