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Applied Optics|February 21, 2008
Numerical and experimental study of grating efficiency for synchrotron monochromatorsA Mirone, E Delcamp, M Idir, et al.Journal of Synchrotron Radiation|July 21, 2004
Optimization strategies for XUV monochromatorsF Polack, E Delcamp, B Lagarde, et al.Physical Review Letters|May 15, 2002
Electromagnetic-field distribution measurements in the soft x-ray range: full characterization of a soft x-ray laser beamS Le Pape, Ph Zeitoun, M Idir, et al.Journal of Synchrotron Radiation|February 22, 2011
GROIN: a fast optical adjustment of a Kirkpatrick-Baez set-upG Cauchon, P LagardeJournal of X-Ray Science and Technology|February 11, 2011
Multilayer x-ray mirror calibration by an energy dispersive method using an x-ray tube and a si(li) detector: absolute reflectivity, energy band pass, and overlapping order determinationP Dhez, H Duval, J C MalaurentThe Review of Scientific Instruments|March 6, 2019
Computation of intensity and polarization state of diffracted fields from reflective gratings in conical geometryA Akarid, F PolackApplied Optics|August 25, 2010
Kirkpatrick-Baez microscope based on a Bragg-Fresnel x-ray multilayer focusing systemP Dhez, A Erko, E Khzmalian, et al.Scanning Microscopy. Supplement|January 1, 1987
The photoelectron x-ray microscope, a possible tool for analytical soft x-ray microscopyF Polack, S LowenthalJournal of X-Ray Science and Technology|March 6, 2012
X-UV lamellar multilayer amplitude gratingsJ M André, A Sammar, R Barchewitz, et al.Optics Letters|September 29, 2009
Twin-image elimination in in-line holography of finite-support complex objectsG Koren, D Joyeux, F PolackPageof 5