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Ultramicroscopy|November 30, 2021
Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopyA Pofelski, I Bicket, G A BottonUltramicroscopy|September 10, 2023
Relation between sampling, sensitivity and precision in strain mapping using the Geometric Phase Analysis method in Scanning Transmission Electron MicroscopyA Pofelski, Y Zhu, G A BottonUltramicroscopy|December 30, 2019
Sampling optimization of Moiré geometrical phase analysis for strain characterization in scanning transmission electron microscopyA Pofelski, S Ghanad-Tavakoli, D A Thompson, et al.Ultramicroscopy|February 8, 2018
2D strain mapping using scanning transmission electron microscopy Moiré interferometry and geometrical phase analysisA Pofelski, S Y Woo, B H Le, et al.Scientific Reports|February 16, 2019
Towards calibration-invariant spectroscopy using deep learningM Chatzidakis, G A BottonUltramicroscopy|July 28, 2006
Electron inelastic scattering and anisotropy: The two-dimensional point of viewG Radtke, G A Botton, J VerbeeckUltramicroscopy|February 16, 2021
Assessment of the strain depth sensitivity of Moiré sampling Scanning Transmission Electron Microscopy Geometrical Phase Analysis through a comparison with Dark-Field Electron HolographyA Pofelski, V Whabi, S Ghanad-Tavakoli, et al.Ultramicroscopy|July 29, 2006
Enhancement of resolution in core-loss and low-loss spectroscopy in a monochromated microscopeS Lazar, G A Botton, H W ZandbergenMicron (Oxford, England : 1993)|November 27, 2007
Investigation of the oxide shell forming on epsilon-Co nanocrystalsN Braidy, S Behal, A Adronov, et al.Micron (Oxford, England : 1993)|November 21, 2016
TEM illumination settings study for optimum spatial resolution and indexing reliability in crystal orientation mappingsA Valery, A Pofelski, L Clément, et al.Pageof 3