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Talanta|October 31, 2008
Ellipsometric studies related to surface-enhanced infrared absorptionE H Korte, A Röseler, M BuskühlAnalytical and Bioanalytical Chemistry|May 22, 2003
Instrumentation for FT-IR reflection spectroscopy with synchrotron radiationM Gensch, K Hinrichs, A Röseler, et al.Applied Optics|August 19, 2010
Infrared refractive index of germanium-silicon alloy crystalsJ Humlícek, A Röseler, T Zettler, et al.Analytical and Bioanalytical Chemistry|October 25, 2002
Infrared ellipsometric view on monolayers: towards resolving structural detailsE H Korte, U Schade, W B Peatman, et al.Analytical and Bioanalytical Chemistry|October 1, 1995
Combined NRA, channeling-RBS and FTIR ellipsometry analyses for the determination of the interface and bonding state of thin SiO(x) and SiN(x)O(y) layersR W Michelmann, H Baumann, A Markwitz, et al.Applied Spectroscopy|December 3, 2003
Fourier transform infrared synchrotron ellipsometry for studying the anisotropy of small organic samplesK Hinrichs, M Gensch, A Röseler, et al.Pageof 1