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Instrumentation for FT-IR reflection spectroscopy with synchrotron radiation
M Gensch1, K Hinrichs, A Röseler
1Institut für Spektrochemie und Angewandte Spektroskopie (ISAS) Department Berlin, Albert-Einstein-Str. 9, 12489, Berlin, Germany. gensch@isas-berlin.de
Analytical and Bioanalytical Chemistry
|May 22, 2003
Summary
This study presents a new experimental setup for infrared reflectance measurements using synchrotron radiation. The setup enhances sample irradiation by over ten times compared to traditional globar sources, improving measurements for small samples.
Area of Science:
- Materials Science
- Spectroscopy
- Synchrotron Radiation Technology
Background:
- Infrared reflectance measurements are crucial for material characterization.
- Traditional sources like globar lamps have limitations in brilliance and sample irradiation efficiency.
- Measuring small samples (<1 mm²) presents significant challenges.
Purpose of the Study:
- To develop and adapt a versatile experimental setup for infrared reflectance measurements utilizing synchrotron radiation.
- To optimize the collimation and polarization of incident synchrotron radiation.
- To evaluate the performance of the new setup, particularly for small sample analysis.
Main Methods:
- Design and implementation of a specialized experimental setup for infrared reflectance spectroscopy.
- Integration of the setup with a synchrotron radiation beamline.
- Characterization of radiation collimation and polarization.
- Performance evaluation using experimental measurements on small samples.
Main Results:
- The developed setup enables versatile infrared reflectance measurements.
- Optimized collimation and polarization of synchrotron radiation were achieved.
- Sample irradiation for areas <1 mm² was improved by over an order of magnitude compared to globar sources.
- Enhanced measurement capabilities for micro-scale samples.
Conclusions:
- The synchrotron radiation-based setup significantly improves infrared reflectance measurements, especially for small samples.
- This advancement offers superior sensitivity and efficiency over conventional methods.
- The versatile setup is well-suited for advanced material analysis and characterization.