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Ultramicroscopy|November 9, 2016
Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopyZ Chen, D J Taplin, M Weyland, et al.Ultramicroscopy|February 13, 2010
A method for correcting the effect of specimen drift on coherent diffractive imagingA V Martin, L J Allen, K IshizukaUltramicroscopy|July 18, 2006
Modelling high-resolution electron microscopy based on core-loss spectroscopyL J Allen, S D Findlay, M P Oxley, et al.Ultramicroscopy|May 21, 2017
Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metricJ A Pollock, M Weyland, D J Taplin, et al.Physical Review Letters|December 31, 2008
Contrast reversal in atomic-resolution chemical mappingP Wang, A J D'Alfonso, S D Findlay, et al.Physical Review Letters|October 4, 2003
Atomic-resolution electron energy loss spectroscopy imaging in aberration corrected scanning transmission electron microscopyL J Allen, S D Findlay, A R Lupini, et al.Ultramicroscopy|May 26, 2015
Energy dispersive X-ray analysis on an absolute scale in scanning transmission electron microscopyZ Chen, A J D'Alfonso, M Weyland, et al.Physical Review Letters|January 13, 2019
Structure Retrieval at Atomic Resolution in the Presence of Multiple Scattering of the Electron ProbeH G Brown, Z Chen, M Weyland, et al.Ultramicroscopy|March 31, 2007
Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopyA J D'Alfonso, S D Findlay, M P Oxley, et al.Ultramicroscopy|July 22, 2008
Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part I: elastic scatteringE C Cosgriff, A J D'Alfonso, L J Allen, et al.Pageof 20