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Abhishek A Sharma

Showing results (1-10 of 5) with videos related to

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ACS Applied Materials & Interfaces|March 16, 2017
Electro-Thermal Model of Threshold Switching in TaO<sub>x</sub>-Based DevicesJonathan M Goodwill, Abhishek A Sharma, Dasheng Li, et al.
ACS Applied Materials & Interfaces|May 4, 2016
Joule Heating-Induced Metal-Insulator Transition in Epitaxial VO2/TiO2 DevicesDasheng Li, Abhishek A Sharma, Darshil K Gala, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 23, 2014
In situ TEM imaging of defect dynamics under electrical bias in resistive switching rutile-TiO₂Ranga J Kamaladasa, Abhishek A Sharma, Yu-Ting Lai, et al.
Nanotechnology|August 25, 2017
ON-state evolution in lateral and vertical VO<sub>2</sub> threshold switching devicesDasheng Li, Abhishek A Sharma, Nikhil Shukla, et al.
ACS Applied Materials & Interfaces|June 29, 2016
Transient Thermometry and High-Resolution Transmission Electron Microscopy Analysis of Filamentary Resistive SwitchesJonghan Kwon, Abhishek A Sharma, Chao-Yang Chen, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
ACS Applied Materials & Interfaces|March 16, 2017
Electro-Thermal Model of Threshold Switching in TaO<sub>x</sub>-Based DevicesJonathan M Goodwill, Abhishek A Sharma, Dasheng Li, et al.
ACS Applied Materials & Interfaces|May 4, 2016
Joule Heating-Induced Metal-Insulator Transition in Epitaxial VO2/TiO2 DevicesDasheng Li, Abhishek A Sharma, Darshil K Gala, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 23, 2014
In situ TEM imaging of defect dynamics under electrical bias in resistive switching rutile-TiO₂Ranga J Kamaladasa, Abhishek A Sharma, Yu-Ting Lai, et al.
Nanotechnology|August 25, 2017
ON-state evolution in lateral and vertical VO<sub>2</sub> threshold switching devicesDasheng Li, Abhishek A Sharma, Nikhil Shukla, et al.
ACS Applied Materials & Interfaces|June 29, 2016
Transient Thermometry and High-Resolution Transmission Electron Microscopy Analysis of Filamentary Resistive SwitchesJonghan Kwon, Abhishek A Sharma, Chao-Yang Chen, et al.
Pageof 1