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Adam Styk

Showing results (1-10 of 6) with videos related to

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Applied Optics|July 5, 2007
Analysis of systematic errors in spatial carrier phase shifting applied to interferogram intensity modulation determinationAdam Styk, Krzysztof Patorski
Optics Express|March 3, 2020
Full-field vibration profilometry using time-averaged interference microscopy aided by variational analysisMaria Cywińska, Maciej Trusiak, Adam Styk, et al.
Optics Express|June 12, 2009
Tilt-shift error detection in phase-shifting interferometryKrzysztof Patorski, Adam Styk, Luigi Bruno, et al.
Materials (Basel, Switzerland)|August 12, 2022
Photogrammetry-Based Volume Measurement Framework for the Particle Density Estimation of LECAKarol Brzeziński, Adam Duda, Adam Styk, et al.
Optics Express|April 1, 2020
Automatic fringe pattern enhancement using truly adaptive period-guided bidimensional empirical mode decompositionPaweł Gocłowski, Maciej Trusiak, Azeem Ahmad, et al.
Sensors (Basel, Switzerland)|March 6, 2019
On-Line Laser Triangulation Scanner for Wood Logs Surface Geometry MeasurementPiotr Siekański, Krzysztof Magda, Krzysztof Malowany, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Applied Optics|July 5, 2007
Analysis of systematic errors in spatial carrier phase shifting applied to interferogram intensity modulation determinationAdam Styk, Krzysztof Patorski
Optics Express|March 3, 2020
Full-field vibration profilometry using time-averaged interference microscopy aided by variational analysisMaria Cywińska, Maciej Trusiak, Adam Styk, et al.
Optics Express|June 12, 2009
Tilt-shift error detection in phase-shifting interferometryKrzysztof Patorski, Adam Styk, Luigi Bruno, et al.
Materials (Basel, Switzerland)|August 12, 2022
Photogrammetry-Based Volume Measurement Framework for the Particle Density Estimation of LECAKarol Brzeziński, Adam Duda, Adam Styk, et al.
Optics Express|April 1, 2020
Automatic fringe pattern enhancement using truly adaptive period-guided bidimensional empirical mode decompositionPaweł Gocłowski, Maciej Trusiak, Azeem Ahmad, et al.
Sensors (Basel, Switzerland)|March 6, 2019
On-Line Laser Triangulation Scanner for Wood Logs Surface Geometry MeasurementPiotr Siekański, Krzysztof Magda, Krzysztof Malowany, et al.
Pageof 1