Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Aimo Winkelmann

Showing results (31-40 of 34) with videos related to

Pageof 4
Sort By:
You have reached the last page of results.This site can display upto 34 results.
Ultramicroscopy|September 13, 2020
Approximant-based orientation determination of quasicrystals using electron backscatter diffractionGrzegorz Cios, Gert Nolze, Aimo Winkelmann, et al.
Acta Biomaterialia|March 28, 2025
Evaluating the single crystallinity of sea urchin calciteSebastian Hoerl, Erika Griesshaber, Antonio G Checa, et al.
Ultramicroscopy|July 27, 2016
Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopyNorbert Schäfer, Angus J Wilkinson, Thomas Schmid, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 10, 2023
Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter DiffractionKieran P Hiller, Aimo Winkelmann, Ben Hourahine, et al.
Pageof 4

Showing results (31-40 of 34) with videos related to

Sort By:
Pageof 4
You have reached the last page of results.This site can display upto 34 results.
Ultramicroscopy|September 13, 2020
Approximant-based orientation determination of quasicrystals using electron backscatter diffractionGrzegorz Cios, Gert Nolze, Aimo Winkelmann, et al.
Acta Biomaterialia|March 28, 2025
Evaluating the single crystallinity of sea urchin calciteSebastian Hoerl, Erika Griesshaber, Antonio G Checa, et al.
Ultramicroscopy|July 27, 2016
Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopyNorbert Schäfer, Angus J Wilkinson, Thomas Schmid, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 10, 2023
Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter DiffractionKieran P Hiller, Aimo Winkelmann, Ben Hourahine, et al.
Pageof 4