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Nanotechnology|June 15, 2013
Three-dimensional doping and diffusion in nano scaled devices as studied by atom probe tomographyAjay Kumar Kambham, Arul Kumar, Antonios Florakis, et al.Ultramicroscopy|March 19, 2013
3D site specific sample preparation and analysis of 3D devices (FinFETs) by atom probe tomographyAjay Kumar Kambham, Arul Kumar, Matthieu Gilbert, et al.Ultramicroscopy|March 19, 2013
Atomic insight into Ge₁₋xSnx using atom probe tomographyArul Kumar, Manu P Komalan, Haraprasanna Lenka, et al.Ultramicroscopy|September 15, 2018
Revealing the 3-dimensional shape of atom probe tips by atomic force microscopyClaudia Fleischmann, Kristof Paredis, Davit Melkonyan, et al.Ultramicroscopy|July 14, 2019
Carrier profiling with fast Fourier transform scanning spreading resistance microscopy: A case study for Ge, GaAs, InGaAs, and InPOberon Dixon-Luinenburg, Umberto Celano, Wilfried Vandervorst, et al.Scientific Reports|September 11, 2020
The impact of focused ion beam induced damage on scanning spreading resistance microscopy measurementsKomal Pandey, Kristof Paredis, Thomas Hantschel, et al.Ultramicroscopy|September 9, 2015
Mapping interfacial excess in atom probe dataPeter Felfer, Barbara Scherrer, Jelle Demeulemeester, et al.Optics Express|April 1, 2020
Size-dependent optical properties of periodic arrays of semiconducting nanolinesAndrzej Gawlik, Janusz Bogdanowicz, Andreas Schulze, et al.Analytical Sciences : the International Journal of the Japan Society for Analytical Chemistry|February 11, 2010
Analysis of ultra-thin HfO(2)/SiON/Si(001): comparison of three different techniquesKenji Kimura, Kaoru Nakajima, Thierry Conard, et al.Environmental Monitoring and Assessment|August 11, 2025
Sewage-driven mosquito proliferation in Urban India: a molecular and environmental correlation study in CoimbatoreAntony Godson, Arul KumarPageof 7