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Nanotechnology|July 15, 2020
Unravelling stacking order in epitaxial bilayer MX<sub>2</sub> using 4D-STEM with unsupervised learningAnkit Nalin Mehta, Nicolas Gauquelin, Magnus Nord, et al.
Nanotechnology|March 29, 2019
Effects of buried grain boundaries in multilayer MoS<sub>2</sub>Jonathan Ludwig, Ankit Nalin Mehta, Marco Mascaro, et al.
Ultramicroscopy|August 21, 2022
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlNRichard J H Morris, Ramya Cuduvally, Jhao-Rong Lin, et al.
Analytical Biochemistry|November 12, 2021
Purification and characterization of a synergistic bioactive lectin from Pleurotus flabellatus (PFL-L) with potent antibacterial and in-vitro radical scavenging activityArul Kumar Murugesan, Karuna Sagaran Gunasagaran
ACS Applied Materials & Interfaces|March 8, 2017
Direct Probing of the Dielectric Scavenging-Layer Interface in Oxide Filamentary-Based Valence Change MemoryUmberto Celano, Jonathan Op de Beeck, Sergiu Clima, et al.
The Journal of Prosthetic Dentistry|May 18, 2025
Influence of tooth preparation design on margin discrepancy and internal gap in digitally fabricated fixed complete coverage zirconia prostheses: A systematic review of in vitro studiesArul Kumar Sengottaiyan, Vincent Bennani, Arthi Veerasamy
Environmental Science and Pollution Research International|May 24, 2022
Study on preparation of brick blocks by using construction waste and sludgeRaguraman Vaithiyasubramanian, Deepasree Srinivasan, Arul Kumar Kanagarajan
The Journal of Prosthetic Dentistry|April 12, 2026
Marginal fit and internal adaptation of zirconia complete coverage fixed dental prostheses fabricated by milling versus 3D printing: A systematic review and meta-analysis of in vitro studiesArul Kumar Sengottaiyan, Vincent Bennani, Arthi Veerasamy
Ultramicroscopy|January 4, 2020
Enhancing the defect contrast in ECCI through angular filtering of BSEsHan Han, Thomas Hantschel, Andreas Schulze, et al.
Ultramicroscopy|January 10, 2020
Application of electron channeling contrast imaging to 3D semiconductor structures through proper detector configurationsHan Han, Thomas Hantschel, Libor Strakos, et al.
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