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Alan J Craven

Showing results (1-10 of 14) with videos related to

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Ultramicroscopy|September 26, 2008
Column ratio mapping: a processing technique for atomic resolution high-angle annular dark-field (HAADF) imagesPaul D Robb, Alan J Craven
Ultramicroscopy|December 3, 2014
Spectrum imaging of complex nanostructures using DualEELS: I. Digital extraction replicasJoanna Bobynko, Ian MacLaren, Alan J Craven
Ultramicroscopy|January 22, 2026
Towards large-area EELS mapping of precipitates in a steel matrix: Comparing low loss and high loss quantificationAlan J Craven, Bianca Sala, Ian MacLaren
Micron (Oxford, England : 1993)|May 29, 2012
Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopyPaul D Robb, Michael Finnie, Alan J Craven
Ultramicroscopy|June 26, 2012
Modelling of AlAs/GaAs interfacial structures using high-angle annular dark field (HAADF) image simulationsPaul D Robb, Michael Finnie, Alan J Craven
Journal of Synchrotron Radiation|February 25, 2005
Specimen charging in X-ray absorption spectroscopy: correction of total electron yield data from stabilized zirconia in the energy range 250-915 eVDimitrios Vlachos, Alan J Craven, David W McComb
Ultramicroscopy|April 6, 2017
Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical couplingAlan J Craven, Hidetaka Sawada, Sam McFadzean, et al.
Ultramicroscopy|August 30, 2016
Accurate measurement of absolute experimental inelastic mean free paths and EELS differential cross-sectionsAlan J Craven, Joanna Bobynko, Bianca Sala, et al.
Ultramicroscopy|December 24, 2017
Spectrum imaging of complex nanostructures using DualEELS: II. Absolute quantification using standardsAlan J Craven, Bianca Sala, Joanna Bobynko, et al.
Microscopy (Oxford, England)|October 17, 2017
EELS at very high energy lossesIan MacLaren, Kirsty J Annand, Colin Black, et al.
Pageof 2

Showing results (1-10 of 14) with videos related to

Sort By:
Pageof 2
Ultramicroscopy|September 26, 2008
Column ratio mapping: a processing technique for atomic resolution high-angle annular dark-field (HAADF) imagesPaul D Robb, Alan J Craven
Ultramicroscopy|December 3, 2014
Spectrum imaging of complex nanostructures using DualEELS: I. Digital extraction replicasJoanna Bobynko, Ian MacLaren, Alan J Craven
Ultramicroscopy|January 22, 2026
Towards large-area EELS mapping of precipitates in a steel matrix: Comparing low loss and high loss quantificationAlan J Craven, Bianca Sala, Ian MacLaren
Micron (Oxford, England : 1993)|May 29, 2012
Characterisation of InAs/GaAs short period superlattices using column ratio mapping in aberration-corrected scanning transmission electron microscopyPaul D Robb, Michael Finnie, Alan J Craven
Ultramicroscopy|June 26, 2012
Modelling of AlAs/GaAs interfacial structures using high-angle annular dark field (HAADF) image simulationsPaul D Robb, Michael Finnie, Alan J Craven
Journal of Synchrotron Radiation|February 25, 2005
Specimen charging in X-ray absorption spectroscopy: correction of total electron yield data from stabilized zirconia in the energy range 250-915 eVDimitrios Vlachos, Alan J Craven, David W McComb
Ultramicroscopy|April 6, 2017
Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical couplingAlan J Craven, Hidetaka Sawada, Sam McFadzean, et al.
Ultramicroscopy|August 30, 2016
Accurate measurement of absolute experimental inelastic mean free paths and EELS differential cross-sectionsAlan J Craven, Joanna Bobynko, Bianca Sala, et al.
Ultramicroscopy|December 24, 2017
Spectrum imaging of complex nanostructures using DualEELS: II. Absolute quantification using standardsAlan J Craven, Bianca Sala, Joanna Bobynko, et al.
Microscopy (Oxford, England)|October 17, 2017
EELS at very high energy lossesIan MacLaren, Kirsty J Annand, Colin Black, et al.
Pageof 2