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Alexander F Moodie

Showing results (1-10 of 5) with videos related to

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Ultramicroscopy|June 14, 2011
A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patternsPhilip N H Nakashima, Alexander F Moodie, Joanne Etheridge
Proceedings of the National Academy of Sciences of the United States of America|August 14, 2013
Direct atomic structure determination by the inspection of structural phasePhilip N H Nakashima, Alexander F Moodie, Joanne Etheridge
Ultramicroscopy|May 27, 2008
A practical guide to the measurement of structure phases and magnitudes by three-beam convergent beam electron diffractionPhilip N H Nakashima, Alexander F Moodie, Joanne Etheridge
Ultramicroscopy|September 29, 2004
Coherent inelastic scattering in Si and TiAlAlexander F Moodie, Tobias A Colson, Harold J Whitfield
Acta Crystallographica. Section A, Foundations of Crystallography|August 19, 2007
Structural phase and amplitude measurement from distances in convergent-beam electron diffraction patternsPhilip N H Nakashima, Alexander F Moodie, Joanne Etheridge
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|June 14, 2011
A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patternsPhilip N H Nakashima, Alexander F Moodie, Joanne Etheridge
Proceedings of the National Academy of Sciences of the United States of America|August 14, 2013
Direct atomic structure determination by the inspection of structural phasePhilip N H Nakashima, Alexander F Moodie, Joanne Etheridge
Ultramicroscopy|May 27, 2008
A practical guide to the measurement of structure phases and magnitudes by three-beam convergent beam electron diffractionPhilip N H Nakashima, Alexander F Moodie, Joanne Etheridge
Ultramicroscopy|September 29, 2004
Coherent inelastic scattering in Si and TiAlAlexander F Moodie, Tobias A Colson, Harold J Whitfield
Acta Crystallographica. Section A, Foundations of Crystallography|August 19, 2007
Structural phase and amplitude measurement from distances in convergent-beam electron diffraction patternsPhilip N H Nakashima, Alexander F Moodie, Joanne Etheridge
Pageof 1