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Surface and Interface Analysis : SIA
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April 19, 2016
A Technique for Calculation of Shell Thicknesses for Core-Shell-Shell Nanoparticles from XPS Data
David J H Cant, Yung-Chen Wang, David G Castner, et al.
Biointerphases
|
December 25, 2016
Peptide engineered microcantilevers for selective chemical force microscopy and monitoring of nanoparticle capture
Martin Munz, Angelo Bella, Santanu Ray, et al.
Journal of Controlled Release : Official Journal of the Controlled Release Society
|
May 12, 2009
Quantitative XPS depth profiling of codeine loaded poly(l-lactic acid) films using a coronene ion sputter source
Ali Rafati, Martyn C Davies, Alexander G Shard, et al.
The Journal of Physical Chemistry. B
|
February 8, 2008
Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS
Alexander G Shard, Felicia M Green, Paul J Brewer, et al.
Analytical Chemistry
|
February 11, 2021
Method for Molecular Layer Deposition Using Gas Cluster Ion Beam Sputtering with Example Application <i>In Situ</i> Matrix-Enhanced Secondary Ion Mass Spectrometry
Matthias Lorenz, Junting Zhang, Alexander G Shard, et al.
Langmuir : the ACS Journal of Surfaces and Colloids
|
May 29, 2015
Correction to "Neutralized Chimeric Avidin Binding at a Reference Biosensor Surface"
Santanu Ray, Rory T Steven, Felicia M Green, et al.
Langmuir : the ACS Journal of Surfaces and Colloids
|
February 5, 2015
Neutralized chimeric avidin binding at a reference biosensor surface
Santanu Ray, Rory T Steven, Felicia M Green, et al.
Analytical Methods : Advancing Methods and Applications
|
March 18, 2026
Optimisation of through-vial Raman analysis of turbid samples by modelling the Raman intensity-depth decay response
Vasundhara Tyagi, Alexander G Shard, Ryan T Coones, et al.
ACS Applied Materials & Interfaces
|
January 7, 2015
3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling
James Bailey, Rasmus Havelund, Alexander G Shard, et al.
Langmuir : the ACS Journal of Surfaces and Colloids
|
March 15, 2019
Sticky Measurement Problem: Number Concentration of Agglomerated Nanoparticles
Caterina Minelli, Dorota Bartczak, Ruud Peters, et al.
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of 4
Search research articles
Search
Showing results (11-20 of 38) with videos related to
Sort By:
Page
of 4
Surface and Interface Analysis : SIA
|
April 19, 2016
A Technique for Calculation of Shell Thicknesses for Core-Shell-Shell Nanoparticles from XPS Data
David J H Cant, Yung-Chen Wang, David G Castner, et al.
Biointerphases
|
December 25, 2016
Peptide engineered microcantilevers for selective chemical force microscopy and monitoring of nanoparticle capture
Martin Munz, Angelo Bella, Santanu Ray, et al.
Journal of Controlled Release : Official Journal of the Controlled Release Society
|
May 12, 2009
Quantitative XPS depth profiling of codeine loaded poly(l-lactic acid) films using a coronene ion sputter source
Ali Rafati, Martyn C Davies, Alexander G Shard, et al.
The Journal of Physical Chemistry. B
|
February 8, 2008
Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS
Alexander G Shard, Felicia M Green, Paul J Brewer, et al.
Analytical Chemistry
|
February 11, 2021
Method for Molecular Layer Deposition Using Gas Cluster Ion Beam Sputtering with Example Application <i>In Situ</i> Matrix-Enhanced Secondary Ion Mass Spectrometry
Matthias Lorenz, Junting Zhang, Alexander G Shard, et al.
Langmuir : the ACS Journal of Surfaces and Colloids
|
May 29, 2015
Correction to "Neutralized Chimeric Avidin Binding at a Reference Biosensor Surface"
Santanu Ray, Rory T Steven, Felicia M Green, et al.
Langmuir : the ACS Journal of Surfaces and Colloids
|
February 5, 2015
Neutralized chimeric avidin binding at a reference biosensor surface
Santanu Ray, Rory T Steven, Felicia M Green, et al.
Analytical Methods : Advancing Methods and Applications
|
March 18, 2026
Optimisation of through-vial Raman analysis of turbid samples by modelling the Raman intensity-depth decay response
Vasundhara Tyagi, Alexander G Shard, Ryan T Coones, et al.
ACS Applied Materials & Interfaces
|
January 7, 2015
3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling
James Bailey, Rasmus Havelund, Alexander G Shard, et al.
Langmuir : the ACS Journal of Surfaces and Colloids
|
March 15, 2019
Sticky Measurement Problem: Number Concentration of Agglomerated Nanoparticles
Caterina Minelli, Dorota Bartczak, Ruud Peters, et al.
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of 4