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Iucrj|January 23, 2015
Precession electron diffraction - a topical reviewPaul A Midgley, Alexander S EggemanActa Crystallographica. Section A, Foundations of Crystallography|April 20, 2012
Refining structures against reflection rank: an alternative metric for electron crystallographyAlexander S Eggeman, Paul A MidgleyNature Communications|June 2, 2015
Scanning precession electron tomography for three-dimensional nanoscale orientation imaging and crystallographic analysisAlexander S Eggeman, Robert Krakow, Paul A MidgleyNature Materials|July 30, 2013
Measurement of molecular motion in organic semiconductors by thermal diffuse electron scatteringAlexander S Eggeman, Steffen Illig, Alessandro Troisi, et al.Journal of Applied Crystallography|October 29, 2020
Density-based clustering of crystal (mis)orientations and the <i>orix</i> Python libraryDuncan N Johnstone, Ben H Martineau, Phillip Crout, et al.Proceedings of the National Academy of Sciences of the United States of America|November 18, 2018
Nanomagnetic properties of the meteorite cloudy zoneJoshua F Einsle, Alexander S Eggeman, Ben H Martineau, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 31, 2004
Extending energy-filtered transmission electron microscopy (EFTEM) into three dimensions using electron tomographyMatthew Weyland, Paul A MidgleyUltramicroscopy|March 5, 2017
Progress and opportunities in EELS and EDS tomographySean M Collins, Paul A MidgleyChemical Communications (Cambridge, England)|May 22, 2004
High-resolution transmission electron microscopy: the ultimate nanoanalytical techniqueJohn Meurig Thomas, Paul A MidgleyNature Materials|March 25, 2009
Electron tomography and holography in materials sciencePaul A Midgley, Rafal E Dunin-BorkowskiPageof 11