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The Review of Scientific Instruments|August 3, 2011
Note: Optical fiber milled by focused ion beam and its application for Fabry-Pérot refractive index sensorWu Yuan, Fei Wang, Alexey Savenko, et al.
Nanotechnology|October 24, 2013
Ultra-high aspect ratio replaceable AFM tips using deformation-suppressed focused ion beam millingAlexey Savenko, Izzet Yildiz, Dirch Hjorth Petersen, et al.
Scientific Reports|April 6, 2018
Tunable Ampere phase plate for low dose imaging of biomolecular complexesAmir H Tavabi, Marco Beleggia, Vadim Migunov, et al.
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