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Small (Weinheim an Der Bergstrasse, Germany)|August 8, 2025
Strategy for One-Step Optimization of Metal Oxide Passivating Contact Materials for Si Heterojunction Solar Cells through Growth Angle VariationAparajita Mandal, Alexis Franquet, Hans Hofsäss, et al.Langmuir : the ACS Journal of Surfaces and Colloids|October 26, 2020
Area-Selective Atomic Layer Deposition of TiN Using Trimethoxy(octadecyl)silane as a Passivation LayerLi Zheng, Wei He, Valentina Spampinato, et al.Analytical Chemistry|July 16, 2020
A Correlative ToF-SIMS/SPM Methodology for Probing 3D DevicesValentina Spampinato, Masoud Dialameh, Alexis Franquet, et al.Analytical Chemistry|January 25, 2022
SIMS Analysis of Thin EUV Photoresist FilmsValentina Spampinato, Alexis Franquet, Danilo De Simone, et al.Materials (Basel, Switzerland)|March 6, 2019
Hybrid Perovskites Depth Profiling with Variable-Size Argon Clusters and Monatomic Ions BeamsCéline Noël, Sara Pescetelli, Antonio Agresti, et al.Beilstein Journal of Nanotechnology|July 7, 2018
Nanoscale electrochemical response of lithium-ion cathodes: a combined study using C-AFM and SIMSJonathan Op de Beeck, Nouha Labyedh, Alfonso Sepúlveda, et al.ACS Applied Materials & Interfaces|October 19, 2019
Material-Selective Doping of 2D TMDC through Al<i></i>O<i></i> EncapsulationAlessandra Leonhardt, Daniele Chiappe, Valeri V Afanas'ev, et al.Nano Letters|April 12, 2014
Three-dimensional observation of the conductive filament in nanoscaled resistive memory devicesUmberto Celano, Ludovic Goux, Attilio Belmonte, et al.Analytical Chemistry|May 3, 2021
Enhanced Laterally Resolved ToF-SIMS and AFM Imaging of the Electrically Conductive Structures in Cable BacteriaRaghavendran Thiruvallur Eachambadi, Henricus T S Boschker, Alexis Franquet, et al.ACS Applied Materials & Interfaces|September 3, 2013
Ultrathin NiGe films prepared via catalytic solid-vapor reaction of Ni with GeH(4)Antony P Peter, Karl Opsomer, Christoph Adelmann, et al.Pageof 2