Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Amit Suratkar

Showing results (1-10 of 2) with videos related to

Pageof 1
Sort By:
Optics Express|April 15, 2010
Reflectometry-based wavelength scanning interferometry for thickness measurements of very thin wafersYoung-Sik Ghim, Amit Suratkar, Angela Davies
Applied Optics|February 2, 2010
Interferometric technique for faceted microstructure metrology using an index matching liquidDaryl Purcell, Amit Suratkar, Angela Davies, et al.
Pageof 1

Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Optics Express|April 15, 2010
Reflectometry-based wavelength scanning interferometry for thickness measurements of very thin wafersYoung-Sik Ghim, Amit Suratkar, Angela Davies
Applied Optics|February 2, 2010
Interferometric technique for faceted microstructure metrology using an index matching liquidDaryl Purcell, Amit Suratkar, Angela Davies, et al.
Pageof 1