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Andreas Schropp

Showing results (11-20 of 37) with videos related to

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Optics Express|October 15, 2022
Rapid aberration correction for diffractive X-ray optics by additive manufacturingFrank Seiboth, Adam Kubec, Andreas Schropp, et al.
Optics Express|June 14, 2025
Rapid aberration correction for diffractive X-ray optics by additive manufacturing: erratumFrank Seiboth, Adam Kubec, Andreas Schropp, et al.
Optics Express|June 14, 2025
Stereo hard X-ray ptychographySina Röper, Sarah-Alexandra Hussak, Karolina Stachnik, et al.
ACS Nano|July 31, 2023
Culling a Self-Assembled Quantum Dot as a Single-Photon Source Using X-ray MicroscopyArka Bikash Dey, Milan K Sanyal, Andreas Schropp, et al.
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|March 15, 2022
Evolution of Hierarchically Porous Nickel Alumina Catalysts Studied by X-Ray PtychographySebastian Weber, Ana Diaz, Mirko Holler, et al.
The Review of Scientific Instruments|October 3, 2014
Bent crystal spectrometer for both frequency and wavenumber resolved x-ray scattering at a seeded free-electron laserUlf Zastrau, Luke B Fletcher, Eckhart Förster, et al.
Journal of Synchrotron Radiation|May 5, 2022
Single-exposure X-ray phase imaging microscopy with a grating interferometerAndreas Wolf, Bernhard Akstaller, Silvia Cipiccia, et al.
Journal of Synchrotron Radiation|May 2, 2015
Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysisMarcin Sikorski, Sanghoon Song, Andreas Schropp, et al.
Optics Letters|December 22, 2012
Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laserDaniel Nilsson, Fredrik Uhlén, Anders Holmberg, et al.
Scientific Reports|September 1, 2025
X-ray near-field multi-slice ptychography for in-situ imagingSina Röper, Karolina Stachnik, Jonas Voss, et al.
Pageof 4

Showing results (11-20 of 37) with videos related to

Sort By:
Pageof 4
Optics Express|October 15, 2022
Rapid aberration correction for diffractive X-ray optics by additive manufacturingFrank Seiboth, Adam Kubec, Andreas Schropp, et al.
Optics Express|June 14, 2025
Rapid aberration correction for diffractive X-ray optics by additive manufacturing: erratumFrank Seiboth, Adam Kubec, Andreas Schropp, et al.
Optics Express|June 14, 2025
Stereo hard X-ray ptychographySina Röper, Sarah-Alexandra Hussak, Karolina Stachnik, et al.
ACS Nano|July 31, 2023
Culling a Self-Assembled Quantum Dot as a Single-Photon Source Using X-ray MicroscopyArka Bikash Dey, Milan K Sanyal, Andreas Schropp, et al.
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|March 15, 2022
Evolution of Hierarchically Porous Nickel Alumina Catalysts Studied by X-Ray PtychographySebastian Weber, Ana Diaz, Mirko Holler, et al.
The Review of Scientific Instruments|October 3, 2014
Bent crystal spectrometer for both frequency and wavenumber resolved x-ray scattering at a seeded free-electron laserUlf Zastrau, Luke B Fletcher, Eckhart Förster, et al.
Journal of Synchrotron Radiation|May 5, 2022
Single-exposure X-ray phase imaging microscopy with a grating interferometerAndreas Wolf, Bernhard Akstaller, Silvia Cipiccia, et al.
Journal of Synchrotron Radiation|May 2, 2015
Focus characterization at an X-ray free-electron laser by coherent scattering and speckle analysisMarcin Sikorski, Sanghoon Song, Andreas Schropp, et al.
Optics Letters|December 22, 2012
Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laserDaniel Nilsson, Fredrik Uhlén, Anders Holmberg, et al.
Scientific Reports|September 1, 2025
X-ray near-field multi-slice ptychography for in-situ imagingSina Röper, Karolina Stachnik, Jonas Voss, et al.
Pageof 4