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Andreas Wucher

Showing results (11-20 of 33) with videos related to

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Surface and Interface Analysis : SIA|December 19, 2013
Retrospective sputter depth profiling using 3D mass spectral imagingLeiliang Zheng, Andreas Wucher, Nicholas Winograd
Applied Surface Science|June 25, 2009
Fundamental studies of molecular depth profiling and 3D imaging using Langmuir-Blodgett films as a modelLeiliang Zheng, Andreas Wucher, Nicholas Winograd
Analytical Chemistry|December 9, 2009
Molecular depth profiling with cluster secondary ion mass spectrometry and wedgesDan Mao, Andreas Wucher, Nicholas Winograd
Journal of the American Society for Mass Spectrometry|October 15, 2015
Dynamic Reactive Ionization with Cluster Secondary Ion Mass SpectrometryHua Tian, Andreas Wucher, Nicholas Winograd
Surface and Interface Analysis : SIA|July 25, 2015
Molecular imaging of biological tissue using gas cluster ionsHua Tian, Andreas Wucher, Nicholas Winograd
Journal of the American Society for Mass Spectrometry|September 24, 2016
Reducing the Matrix Effect in Organic Cluster SIMS Using Dynamic Reactive IonizationHua Tian, Andreas Wucher, Nicholas Winograd
Analytical Chemistry|July 13, 2011
Molecular depth profiling by wedged crater bevelingDan Mao, Caiyan Lu, Nicholas Winograd, et al.
Journal of the American Society for Mass Spectrometry|August 16, 2005
Energetic ion bombardment of Ag surfaces by C60+ and Ga+ projectilesShixin Sun, Christopher Szakal, Nicholas Winograd, et al.
Analytical Chemistry|December 15, 2004
Molecular depth profiling of histamine in ice using a buckminsterfullerene probeAndreas Wucher, Shixin Sun, Christopher Szakal, et al.
Journal of the American Society for Mass Spectrometry|March 8, 2017
On the SIMS Ionization Probability of Organic MoleculesNicholas J Popczun, Lars Breuer, Andreas Wucher, et al.
Pageof 4

Showing results (11-20 of 33) with videos related to

Sort By:
Pageof 4
Surface and Interface Analysis : SIA|December 19, 2013
Retrospective sputter depth profiling using 3D mass spectral imagingLeiliang Zheng, Andreas Wucher, Nicholas Winograd
Applied Surface Science|June 25, 2009
Fundamental studies of molecular depth profiling and 3D imaging using Langmuir-Blodgett films as a modelLeiliang Zheng, Andreas Wucher, Nicholas Winograd
Analytical Chemistry|December 9, 2009
Molecular depth profiling with cluster secondary ion mass spectrometry and wedgesDan Mao, Andreas Wucher, Nicholas Winograd
Journal of the American Society for Mass Spectrometry|October 15, 2015
Dynamic Reactive Ionization with Cluster Secondary Ion Mass SpectrometryHua Tian, Andreas Wucher, Nicholas Winograd
Surface and Interface Analysis : SIA|July 25, 2015
Molecular imaging of biological tissue using gas cluster ionsHua Tian, Andreas Wucher, Nicholas Winograd
Journal of the American Society for Mass Spectrometry|September 24, 2016
Reducing the Matrix Effect in Organic Cluster SIMS Using Dynamic Reactive IonizationHua Tian, Andreas Wucher, Nicholas Winograd
Analytical Chemistry|July 13, 2011
Molecular depth profiling by wedged crater bevelingDan Mao, Caiyan Lu, Nicholas Winograd, et al.
Journal of the American Society for Mass Spectrometry|August 16, 2005
Energetic ion bombardment of Ag surfaces by C60+ and Ga+ projectilesShixin Sun, Christopher Szakal, Nicholas Winograd, et al.
Analytical Chemistry|December 15, 2004
Molecular depth profiling of histamine in ice using a buckminsterfullerene probeAndreas Wucher, Shixin Sun, Christopher Szakal, et al.
Journal of the American Society for Mass Spectrometry|March 8, 2017
On the SIMS Ionization Probability of Organic MoleculesNicholas J Popczun, Lars Breuer, Andreas Wucher, et al.
Pageof 4