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Anjam Khursheed
Wei Kean Ang

Showing results (1-10 of 15) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 10, 2016
Annular Focused Electron/Ion Beams for Combining High Spatial Resolution with High Probe CurrentAnjam Khursheed, Wei Kean Ang
Nature Communications|March 31, 2018
A high-brightness large-diameter graphene coated point cathode field emission electron sourceXiuyuan Shao, Avinash Srinivasan, Wei Kean Ang, et al.
Ultramicroscopy|May 12, 2005
A method of dynamic chromatic aberration correction in low-voltage scanning electron microscopesAnjam Khursheed
Ultramicroscopy|March 12, 2013
Design of a focused electron beam column for ring-cathode sourcesAnjam Khursheed
Ultramicroscopy|December 21, 2002
Aberration characteristics of immersion lenses for LVSEMAnjam Khursheed
Materials (Basel, Switzerland)|December 24, 2021
The Design of a Reflection Electron Energy Loss Spectrometer Attachment for Low Voltage Scanning Electron MicroscopyJonathan Chuah, Anjam Khursheed
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 18, 2014
Probing and analyzing buried interfaces of multifunctional oxides using a secondary electron energy analyzerAvinash Srinivasan, Anjam Khursheed
Scanning|December 23, 2004
A spectroscopic scanning electron microscope designAnjam Khursheed, Mans Osterberg
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 31, 2015
Voltage and Dopant Concentration Measurements of Semiconductors using a Band-Pass Toroidal Energy Analyzer Inside a Scanning Electron MicroscopeAvinash Srinivasan, Anjam Khursheed
Ultramicroscopy|October 28, 2008
A second-order focusing electrostatic toroidal electron spectrometer with 2pi radian collectionAnjam Khursheed, Hung Quang Hoang
Pageof 2

Showing results (1-10 of 15) with videos related to

Sort By:
Pageof 2
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 10, 2016
Annular Focused Electron/Ion Beams for Combining High Spatial Resolution with High Probe CurrentAnjam Khursheed, Wei Kean Ang
Nature Communications|March 31, 2018
A high-brightness large-diameter graphene coated point cathode field emission electron sourceXiuyuan Shao, Avinash Srinivasan, Wei Kean Ang, et al.
Ultramicroscopy|May 12, 2005
A method of dynamic chromatic aberration correction in low-voltage scanning electron microscopesAnjam Khursheed
Ultramicroscopy|March 12, 2013
Design of a focused electron beam column for ring-cathode sourcesAnjam Khursheed
Ultramicroscopy|December 21, 2002
Aberration characteristics of immersion lenses for LVSEMAnjam Khursheed
Materials (Basel, Switzerland)|December 24, 2021
The Design of a Reflection Electron Energy Loss Spectrometer Attachment for Low Voltage Scanning Electron MicroscopyJonathan Chuah, Anjam Khursheed
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 18, 2014
Probing and analyzing buried interfaces of multifunctional oxides using a secondary electron energy analyzerAvinash Srinivasan, Anjam Khursheed
Scanning|December 23, 2004
A spectroscopic scanning electron microscope designAnjam Khursheed, Mans Osterberg
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 31, 2015
Voltage and Dopant Concentration Measurements of Semiconductors using a Band-Pass Toroidal Energy Analyzer Inside a Scanning Electron MicroscopeAvinash Srinivasan, Anjam Khursheed
Ultramicroscopy|October 28, 2008
A second-order focusing electrostatic toroidal electron spectrometer with 2pi radian collectionAnjam Khursheed, Hung Quang Hoang
Pageof 2