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Annelies De Wael

Showing results (1-10 of 6) with videos related to

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Ultramicroscopy|October 22, 2020
Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitationsAnnelies De Wael, Annick De Backer, Sandra Van Aert
Ultramicroscopy|October 2, 2021
Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tiltAnnelies De Wael, Annick De Backer, Ivan Lobato, et al.
Ultramicroscopy|March 16, 2017
Hybrid statistics-simulations based method for atom-counting from ADF STEM imagesAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
Physical Review Letters|March 29, 2020
Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron MicroscopyAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 19, 2022
Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEMAnnelies De Wael, Annick De Backer, Chu-Ping Yu, et al.
Nanoscale|January 12, 2021
Three-dimensional atomic structure of supported Au nanoparticles at high temperaturePei Liu, Ece Arslan Irmak, Annick De Backer, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|October 22, 2020
Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitationsAnnelies De Wael, Annick De Backer, Sandra Van Aert
Ultramicroscopy|October 2, 2021
Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tiltAnnelies De Wael, Annick De Backer, Ivan Lobato, et al.
Ultramicroscopy|March 16, 2017
Hybrid statistics-simulations based method for atom-counting from ADF STEM imagesAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
Physical Review Letters|March 29, 2020
Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron MicroscopyAnnelies De Wael, Annick De Backer, Lewys Jones, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 19, 2022
Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEMAnnelies De Wael, Annick De Backer, Chu-Ping Yu, et al.
Nanoscale|January 12, 2021
Three-dimensional atomic structure of supported Au nanoparticles at high temperaturePei Liu, Ece Arslan Irmak, Annick De Backer, et al.
Pageof 1