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Ultramicroscopy|June 26, 2009
Complementary techniques for the characterization of thin film Ti/Nb multilayersArda Genç, Rajarshi Banerjee, Gregory B Thompson, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 20, 2017
A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen PreparationPaul E Fischione, Robert E A Williams, Arda Genç, et al.Pageof 1