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Optics Express|October 14, 2010
Absolute measurement of surface and bulk absorption in DUV optics from temperature induced wavefront deformationBernd Schäfer, Matthias Schöneck, Armin Bayer, et al.
Optics Express|April 15, 2010
Damage threshold measurements on EUV optics using focused radiation from a table-top laser produced plasma sourceFrank Barkusky, Armin Bayer, Stefan Döring, et al.
The Review of Scientific Instruments|October 2, 2009
Radiation damage resistance of AlGaN detectors for applications in the extreme-ultraviolet spectral rangeFrank Barkusky, Christian Peth, Armin Bayer, et al.
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