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Nanotechnology|September 6, 2012
Wafer scale imprint uniformity evaluated by LSPR spectroscopy: a high volume characterization method for nanometer scale structuresClaus Jeppesen, Daniel Nilsson Lindstedt, Asger Laurberg Vig, et al.The Review of Scientific Instruments|December 2, 2009
Windowless microfluidic platform based on capillary burst valves for high intensity x-ray measurementsAsger Laurberg Vig, Kristoffer Haldrup, Nikolaj Enevoldsen, et al.Pageof 1