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Aurélien Moy

Showing results (1-10 of 8) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 8, 2021
<i>ϕ</i>(<i>ρz</i>) Distributions in Bulk and Thin Film Samples for EPMA. Part 1: A Modified <i>ϕ</i>(<i>ρz</i>) Distribution for Bulk Materials, Including Characteristic and Bremsstrahlung FluorescenceAurélien Moy, John Fournelle
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 4, 2021
<i>ϕ</i>(<i>ρz</i>) Distributions in Bulk and Thin-Film Samples for EPMA. Part 2: BadgerFilm: A New Thin-Film Analysis ProgramAurélien Moy, John Fournelle
Analytical Chemistry|July 7, 2015
Standardless Quantification of Heavy Elements by Electron Probe MicroanalysisAurélien Moy, Claude Merlet, Olivier Dugne
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 25, 2021
Electron Probe Microanalysis of Transition Metals using L lines: The Effect of Self-absorptionXavier Llovet, Aurélien Moy, John H Fournelle
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 13, 2019
Quantitative Measurement of Iron-Silicides by EPMA Using the Fe Lα and Lβ X-ray Lines: A New Twist to an Old ApproachAurélien Moy, John Fournelle, Anette von der Handt
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
Assessing the Accuracy of Mass Attenuation Coefficients for Soft X-ray EPMAXavier Llovet, Philipp Pöml, Aurélien Moy, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
An Improved Average Atomic Number Calculation for Estimating Backscatter and Continuum Production in CompoundsJohn Donovan, Andrew Ducharme, Joseph J Schwab, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
A New Method for Dead Time Calibration and a New Expression for Correction of WDS Intensities for MicroanalysisJohn J Donovan, Aurélien Moy, Anette von der Handt, et al.
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Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 8, 2021
<i>ϕ</i>(<i>ρz</i>) Distributions in Bulk and Thin Film Samples for EPMA. Part 1: A Modified <i>ϕ</i>(<i>ρz</i>) Distribution for Bulk Materials, Including Characteristic and Bremsstrahlung FluorescenceAurélien Moy, John Fournelle
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 4, 2021
<i>ϕ</i>(<i>ρz</i>) Distributions in Bulk and Thin-Film Samples for EPMA. Part 2: BadgerFilm: A New Thin-Film Analysis ProgramAurélien Moy, John Fournelle
Analytical Chemistry|July 7, 2015
Standardless Quantification of Heavy Elements by Electron Probe MicroanalysisAurélien Moy, Claude Merlet, Olivier Dugne
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 25, 2021
Electron Probe Microanalysis of Transition Metals using L lines: The Effect of Self-absorptionXavier Llovet, Aurélien Moy, John H Fournelle
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 13, 2019
Quantitative Measurement of Iron-Silicides by EPMA Using the Fe Lα and Lβ X-ray Lines: A New Twist to an Old ApproachAurélien Moy, John Fournelle, Anette von der Handt
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
Assessing the Accuracy of Mass Attenuation Coefficients for Soft X-ray EPMAXavier Llovet, Philipp Pöml, Aurélien Moy, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 25, 2023
An Improved Average Atomic Number Calculation for Estimating Backscatter and Continuum Production in CompoundsJohn Donovan, Andrew Ducharme, Joseph J Schwab, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
A New Method for Dead Time Calibration and a New Expression for Correction of WDS Intensities for MicroanalysisJohn J Donovan, Aurélien Moy, Anette von der Handt, et al.
Pageof 1